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TP83C251SB16 Datasheet
The CRD continually monitors the data frequency at the se- lected data inputs. If this input frequency drops below l/2 the minimum allowed frequency (about 3 MHz) the CRD resets itself by internally deasserting CRD-EN. This centers the crystal frequency, and restarts the internal VCO. The CRD EN pin is provided to initialize the CLK DET circuit- ry and enable the crystal to track incoming data. The part is enabled when this pin is active High. Deassertion of this pin will cause the CLK DET circuitry and the OSC FLTR + pins to be disabled in a manner similar to when legitimate data is not being received. Deassertion of the CRD EN pin also momentarily causes (1 p,s) the VCO FLTR pin to be pulled to ground and stops the VCO and RXC + outputs. After this time, the VCO will be restarted and its output frequency will climb quickly to approximately 250 MHz.
TP83C251SB16 Price
The LT1054 is a bipolar, switched-capacitor voltage converter with regulator. It provides higher output current and significantly lower voltage losses than previously available converters. An adaptive-switch drive scheme optimizes efficiency over a wide range of output currents. Total voltage drop at 100-mA output current typically is l.1 V. This applies to the full supply-voltage range of 3.5 V t0 15 V. Quiescent current typically is 2.5 mA.
TP83C251SB16 on stock

Timing Diagram \ic-- ift-/' Latch / Inpul LdLLIIc- F tS th+ Compare - - - 1.4V Latch LpwkU)
\ / j| vOs
1 tpd 7 1 td+(DJ 7
Comparator _ _ _ OJtput | | |j
Definition of Terms
Definition
vos Inpui Offset Voltage - Voltage applied between the two input terminals to obtain CMOS logic threshold at the output
VIN Inpui Voliage Pulse Amplitude - Usually set to lOOmV for comparator specifications
VOD Input Voltage Overdrive - Usually set t0 5mV and in opposite polarity to VIN for comparator specifications
tpd+ Input to Output High Delay - The propagation delay measured from the time the input signal crosses the input offset voltage to the CMOS logic threshold of an output low to high transition
Ipd- Input to Output Low Delay - The propagation delay measured from the time the input signal crosses the input offset voltage to the CMOS logic threshold of an output high Io low transition
td+ Latch Disable to Output High Delay - The propagation delay measured from the latch signal crossing the CMOS threshold in a low to high transition to the point of the outpui crossing CMOS threshold in a low to high transition
td Latch Disable to Output Low Delay - The propagation delay measured from the latch signal crossing the CMOS threshold in a low to high transition to the point of the output crossing CMOS threshold in a high to low transition
tS Minimum Setup Time - The minimum time before the negative transition of the latch signal that an input signal change must be present in order to be acquired and held at the outputs
th Minimum Hold Time - The minimum time after the negative transition of the latch signal that an input signal must remain unchanged in order to be acquired and held at the outpui
tnw(D) Minimum Lalch Disable Pulse Width - The minimum time that the laich signal musl remain high in order to acquire and hold an input signal change


(5) When designing your equipment, comply with the guaranteed values, in particular those of maxi- mum rating, the range of operating power supply voltage and heat radiation characteristics. Other- wise, we will not be liable for any defect which may arise later in your equipment. Even when the products are used within the guaranteed values, redundant design is recommended, so that such equipment may not violate relevant laws or regulations because of the function of our products.