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suppliers of STTLDFMM-236 and PDF data of STTLDFMM-236

Part Numbert Mfg Packt D/C Descriptiont Qty Company/Contact  
STTLDFMM-236 650 
    Yingxinyuan Intl(Group) ltd.
  • Contact:celina
  • Tel:86-755-83247111
  • Fax:86-755-83342111
  • Email: yixy@yxsmd.com


STTLDFMM-236     1300 
    Yingxinyuan Intl(Group) ltd.
  • Contact:celina
  • Tel:86-755-83247111
  • Fax:
  • Email: yixy@yxsmd.com

STTLDFMM-236 Datasheet
1 10 years mmimum data retention in the absence of external power ' Data is automatically protected during power loss ' Power supply monitor resets processor when Vcc power loss occurs and holds processor in reset during Vcc ramp-up ' Battery monitor checks remaining capacity daily I Read and write access times as fast as 70 ns I Unlimited write cycle endurance ' Typical standby current 50A ' Upgrade for 128k x 8 SRAM, EEPROM or Flash ' Lithium battery is electrically disconnected to retain freshness until power is applied for the first time ' Full+10% Vcc operating range (DS1345Y) or optional +5% Vcc operating range (DS1345AB) ' Optionalindustrialtemperature range of -40'IC to +85'fC, designated IND ' New PowerCap Module (PCM) package - Directly surface-mountable module - Replaceable snap-on PowerCap provides lithium backup battery - Standardized pinout for all nonvolatile SRAM products - Detachment feature on PowerCap allows easy removal using a regular screwdriver
STTLDFMM-236 Price

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STTLDFMM-236 on stock

Item Symbol Condition mm typ. max Unit
ICES VCE = +60V, IE = 0 ±400 A
Collector cutoff current ICFO VCE = +30V, IB = 0 ±700 A
Ermtter cutoff current IEBO VEB=+5V,IC=O ±1 mA
Collector-emitter voltage VCEO Ic = +30mA, IB = O ±60 v
hl-El VCE = +4V, Ic = +1A 70 250
DC current gain hFE2 VCE = +4V, Ic = +3A 15
Base-emitter voltage VBE VCE = +4V, Ic = +3A ±2 v
Collector-emitter saturation voltage VCF. (saL) Ic = +4A, IB = +0.4A ±1.5 v
Transition frequency fT VCE = +5V, lC = +0.5A, f =1MHz 20 MHz
IUmOn tlme ton (typ.) NPN:0.3, PNP:0.2 S
Storage tune tstg Ic = +4A, IBl= +0.4A, IB2 =0.4A (typ.) NPN:1.2, PNP:0.5 S
Fall time tf (typ.) NPN:0.4, PNP:0.2 S


This integrated circuit can be damaged by ESD. Texas Instru- ments recommends that allintegrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degrada- tion to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.