| | | | | | | Ta-25'C VDD-30V Ves-lOV |
| | | | | | | RG-IO C> Pulsed |
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| | | | | | .d(ofi | | | |
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| | | | | | Td(orj | | | |
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Notes: 1. Long Term Input Offset Voltage Stability refers to the averaged trend line of VOS vs. Time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 0perating days are typically 2.5 yV. 2. Guaranteed by design. 3. Input Offset Voltage measurements are periormed by automated test equipment approximately 0.5 seconds after application of power. 4. The input protection diodes do not allow the device to be removed or inserted into the circuit without first removing power.