| Part Numbert | Mfg | Packt | D/C | Descriptiont | Qty | Company/Contact |
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STP411B-320 Datasheet t stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE l: The input-voltage ratings may be exceeded provided the input-current ratings are observed. STP411B-320 Price
STP411B-320 on stock Windowed products offer the ability to erase the mem- ory array. The memory matrix is erased to the all "1 s state when exposed to ultraviolet light at wavelengths < 4000 Angstroms (A). The recommended procedure is to expose the erasure window of device to a cam- mercial UV source emitting at 2s37 A with an intensity of 12,OOOyW/cm2 at l'. The erasure time at that dis- tance is about 15 t0 20 min. Clock recovery is performed by synchronizing the on-chip VCO directly to the incoming data stream. The low-jitter, LVDS interface guarantees bit error compliance with the Telcordia GR-25 3-CORE, ANSI, and ITU- T standards. The BCM8220 is packaged in a 14 x 14 mm, 100-pin LQFP package or an 11 x 11 mm, 100-pin BGA package. |
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