| Part Numbert | Mfg | Packt | D/C | Descriptiont | Qty | Company/Contact | |
| SMCJ6054TR-13 | Microsemi | 2009+ | 100000 |
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| SMCJ6054TR-13 | Microsemi | 2009+ | 100000 |
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SMCJ6054TR-13 Datasheet UART .. Serial Port Control Register (SCON) . . . . . . . . . Baud Rates .. Using Timer l to Generate Baud Rates . . . . . . . More About UART Mode 0 ..... More About UART Mode l ..... More About UART Modes 2 and 3 ........... Multiprocessor Communications . . . . . . . . . . . . . Automatic Address Recognition . ' ' ' ' ' ' ' ' ' ' ' ' Watchdog Timer . . . . . . . . . Watchdog Feed Sequence ..... Watchdog Reset . . . . . . Additional Features . . . . . . Software Reset . . . . . . . Dual Data Pointers . . . . EPROM Characteristics . . 32-Byte Customer Code Space . . . . . . . . . . . . . System Configuration Bytes .... Security Bits . . . . . . . . . . ABSOLUTE MAXIMUM RATINGS ............... DC ELECTRICAL CHARACTERISTICS .......... COMPARATOR ELECTRICAL CHARACTERISTICS AC ELECTRICAL CHARACTERISTICS .......... REVISION HISTORY ....... SMCJ6054TR-13 on stock >Host can use complete spare area except Bl and ECC code area. For example, Host can write data to Spare area buffer except for the area controlled by ECC logic at program operation. >ln case of 'with ECC' mode, OneNAND automatically generates ECC code for both main and spare data of memory during program operation, but does not update ECC code to spare bufferRAM during load operation. >When loading/programming spare area, spare area BufferRAM address(BSA) and BufferRAM sector count(BSC) is chosen via Start buffer register as it is. *Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating Conditions for extended periods may affect device reliability. |
