| Part Numbert | Mfg | Packt | D/C | Descriptiont | Qty | Company/Contact | |
| SKKE12 | SEMIKRON | 原装正品模块 | 06+ | 100 |
|
||
| SKKE12 | SEMIKRON | 模块 | 280 |
|
|||
| SKKE12 | 1700 | SEMIKRON | 模块 |
|
|||
| SKKE12 | SEMIKRON | 模块 | 280 |
|
|||
| SKKE12 | SEMIKRON |
|
|||||
| SKKE12 | MODULE | SEMIKRON |
|
SKKE12 Datasheet
SKKE12 Price
SKKE12 on stock While the device is in ONCE Mode, the Port o pins go into a float state, and the other port pins and ALE and PSEN are weakly pulled high. The oscillator circuit remains active. While the 8XC51 FA/FB is in this mode. an emulator or test CPU can be used to drive the Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at Vcc = 5V, Tamb = 25IC. 3. Not more than one output should be shorted at a time. For testing los, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, los tests should be performed last. |
||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||