| Part Numbert | Mfg | Packt | D/C | Descriptiont | Qty | Company/Contact | |
| SKIIP82ANB08 | SEMIKRON | 09+ | 1 |
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| SKIIP82ANB08 | SEMIKRON | Module | new and original | 1 |
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| SKIIP82ANB08 | SEMIKRON | 05+ | new and original | 1 |
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| SKIIP82ANB08 | SEMIKRON | MODULE | 1 |
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| SKIIP82ANB08 | SEMIKRON | THY+DIO | 2005+ | THY+DIO | 10 |
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| SKIIP82ANB08 | SEMIKRON | IGBT | 08+ | 1 |
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| SKIIP82ANB08 | SEMIKRON | 1 |
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SKIIP82ANB08 Datasheet
SKIIP82ANB08 Price Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to abso!ute maximum rating conditions for extended periods may affect device reliabi!ity. SKIIP82ANB08 on stock NOTES: 1. Initial program pulse width tolerance is lms t5%. 2. Thelength of the overprogram pulse may vary from 2.85msec t0 78.75msec as a function of iteration counter value X. 3. The parameter is only sampled and is not 100% tested. Ouput Float is defined as the point where datais no longer driven - see timing diagram. 4. During programming, a O.lFrf capaatoris required from Vpp to GND node, to suppress voltage transients that can damage the device.
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