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QS3244SO8 Datasheet
W963L6ABN is a 8M bits CMOS pseudo static random access memory (Pseudo SRAM), organized as 512K words x 16 bits. Using advanced single transistor DRAM architecture and 0.175 Um process technology; W963L6ABN delivers fast access cycle time and low power consumption. It is suitable for mobile device application such as Cellular Phone and PDA, which high-density buffer is needed and power dissipation is most concerned.
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The lC includes also a programmable soft-start, slope compensation for stable operation at duty cycles greater then 50%, a disable function, a leading edge blanking on current sense to improve noise immunity, latched disable for OVP or OTP shutdown and an effective two-level OCP able to protect the system even in case the secondary diode fails short.
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Pin No. Function
AO-A8 Address Inputs
RAS Row Address Strobe
OE Output Enable
1101-1/04 Data Input/Output
CAS Column Address Strobe
WE Read/Write Input
Vcc Power Supply (+ 5 V)
Vss Ground fo V)
NC. No Connection


Symbol Parameter Conditions Typical (Note 4) LM4040AIM3 Limits (Note 5) LM4040BIM3 Limits (Note 5) LM4040CIM3 Limits (Note 5) Units ( Limit)
VR Reverse Breakdown Voltage IR= 100cCA 2.500 V
Reverse Breakdown Voltage Tolerance IR= 100cCA +2.5 ±19 +5.0 ±21 ±12 ±29 mV (max) mV (max)
IRMIN Minimum Operating Current 45 60 65 60 65 60 65 A (max) (max)
CVR Average Reverse Breakdown Voltage Temperature Coefficient IR = 10mA IR = 1mA IR = 100cCA 20 15 15 100 100 100 ppm/IC ppm/IC (max) ppm/IC (max)
CVR/CIR Reverse Breakdown Voltage Change with Operating Current Change IRMIN " IR lmA 0.3 0.8 1.0 0.8 1.0 0.8 1.0 mV mV (max) mV (max)
1mAIR 15mA 2.5 0.6 8.0 0.6 8.0 0.6 8.0 mV mV (max) mV (max)
zR Reverse Dynamic Impedance IR = 1mA, f = 120Hz IAC = 0.1 IR 0.3 0.8 0.8 0.9 l l(max)
eN Wideband Noise IR = 100cCA 10Hz " f" 10kHz 35 cd/RMS
R Reverse Breakdown Voltage Long Term Stability t = 1000hrs T = 25IC +O.1IC lra = 100ccA 120 ppm
Symbol Parameter Conditions Typical (Note 4) LM4040DIM3 Limits (Note 5) Units ( Limit)
VR Reverse Breakdown Voltage IR= 100cCA 2.500 V
Reverse Breakdown Voltage Tolerance IR= 100cCA +25 ±49 mV (max) mV (max)
IRMIN Minimum Operating Current 45 65 70 ccA (max) q(max)
R Average Reverse Breakdown Voltage Temperature Coefficient IR = 10mA IR = 1mA IR = 100cCA 20 15 15 150 ppm/lC ppm/IC (max) ppm/IC (max)
q;VR/21R Reverse Breakdown Voltage Change with Operating Current Change IRMIN " IR lmA 0.3 1.0 1.2 mV mV (max) mV (max)
1mAIR 15mA 2.5 8.0 10.0 mV mV (max) mV (max)
zR Reverse Dynamic Impedance IR = 1mA, f = 120Hz IAC = 0.1 IR 0.3 1.1 l l(max)
eN Wideband Noise IR = 100cCA 10Hz " f" 10kHz 35 c~VRMS
R Reverse Breakdown Voltage Long Term Stability t = 1000hrs T = 25IC +O.1IC IR = 100cCA 120 ppm