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1. The quoted values of ~Vref are based on a constant current lz. Two factors can cause QVref to change, namely the differential resistance rdif and the temperature coefficient Sz. a) As the max. rdif of the device can be 15 I , a change of 0.01 mA in the current through the reference diode will result in a ~Vref of 0.01 mA x is I = 0.15 mV. This level of C2Vref iS not significant on a lN821 (CVref < 96 mV), it is however very significant on a lN829 (QVref < 5 mV). b) The temperature coefficient of the reference voltage Sz is a function of lz. Reference diodes are classified at the specified test current and the Sz of the reference diode will be different at different levels of lz. The absolute value of lz is important, however, the stability of lz, once the level has been set, is far more significant. This applies particularly to the lN829. The effect of the stability of lz on Sz is shown in Fig.3. 2. All reference diodes are characterized by the 'box method'. This guarantees a maximum voltage excursion (C2Vref) over the specified temperature range, at the specified test current (lz), verified by tests at indicated temperature points within the range. Vz is measured and recorded at each temperature specified. The CVref between the highest and lowest values must not exceed the maximum QVref given. Therefore the temperature coefficient is only given as
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