ADMap-18  > PC1696

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PC1696 Datasheet

TC7MH161FK TC7MH163FK Outputs
Inputs Inputs Function
CLR LD ENP ENT CK CLR LD ENP ENT CK QA QB oc QD
L x x x x L x x x f L L L L Reset to "0"
H L x x f H L x x 5 A B c D Reset data
H H x L 5 H H x L f No change No count
H H L x 5 H H L x 5 No change No count
H H H H 5 H H H H 5 Count up Count
H x x x 1 x x x x 1 No change No count


PC1696 Price

SB820 SB830 SB840 SB850 SB860 SB880 SB8100 UNITf
Maximum Recurrent Peak Reverse Voltaqe 20 30 40 50 60 80 1 00 V
Maximum RMS Voltaqe 1 4 21 26 35 42 56 80 V
Maximum DC Blockinq Voltaqe 20 30 40 50 60 80 1 00 V
Maximum Average Forward Rectified Current at Tc=100 CJ 8O A
Peak Forward Surge Current, 8.3ms single half sine wave superimposed on rated load(J EDEC method) 1 50 A
Maximum Forward Voltaqe at 8.OA per element O55 0.75 0.85 V
Maximum DC Reverse Current at Rated Tc=25 CJ DC Blocking Voltage per element Tc=100 CJ O5 50 mA
Typical Thermal Resistance Note R ~KJA 60 CJ/W
Operating and Storage Temperature Range TJ -50 TO +125


PC1696 on stock

E111f
G SmaIISignaIPowerGain f = 0 1 -1 0 G H z f = 1 0-2 0 G H z f = 2 0-3 0 G H z dB dB dB 1 8 0 1 6 0 1 5 0 2 0 0 1 8 0 1 7 0
G GainFlatness f=0120GHz dB +1 0
BW3dB 3 d B B a n d w id th GHz 3 0
PidB OutputPoweratldBCompression f=20GHz dBm 1 8 0
NF N oise Figure f=20GHz dB 4 2 5 0
VSWR Input / O utput f=0180GHz 1 51
l P 3 ThirdOrderlnterceptPoint f=20GHz dBm 3 4 0
T G ro up D ela V f=20GHz 1 2 0
ISOL Reverselsolation f=0180GHz dB 2 2 0
VD Device Voltage V 4 3 5 0 5 7
dG/dT D evice G ain Te m p e ra tu re C o e fficie n t dBldegC 0 0 0 2 7
d Vld T D evice Volta g e Te m p e ra tu re C o e fficie n t m Vld e o C 5 0


Quality: Mitsubishi Electric is not liable for failures resulting from base station operation time or operating conditions exceeding those of mobile radios. This module technology results from more than 20 years of experience, field proven in tens of millions of mobile radios. Currently, most returned modules show failures such as ESD, substrate crack, and transistor burnout, which are caused by improper handling or exceeding recommended operating conditions. Few degradation failures are found.