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PBL3811-2 ROP10 Datasheet
t stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. This are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. Voltage values are with respect to network ground terminal. 2. This is the maximum voltage that should be applied to any output when it is in the off state.
PBL3811-2 ROP10 Price

ID= Bf ^ l f
VaS - .oov V09 - 250V
VD5 =I
l
l F TEST CICUIT SEE FISUFIE 13a&b


PBL3811-2 ROP10 on stock

PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Output Frequency fOUT vcc = 3.3V or VBAT = 3.3V 32 768 kHz
vcc = 3.3V or OoC to +400C +2
Frequency Stability vs. Temperature (Commercial) Af/fOUT VBAT = 3.3V, aging offset = OOh >400C to +700C +3.5 ppm
vcc = 3.3V or -400C to <OoC +3.5
Frequency Stability vs. Af/fOUT VBAT = 3.3V, OoC to +400C +2 ppm
Temperature (lndustrial) aging offset = OOh >400C to +850C +3.5
Frequency Stability vs. Voltage AfN 1 ppmN
-400C 0 7
+250C 0 1
Trim Register Frequency Sensitivity per LSB Af/LSB Specified at: +700C 0 4 ppm
+850C 0 8
Temperature Accuracy Temp vcc = 3.3V or VBAT = 3.3V -3 +3 oc
After reflow, First year ±1 0
Crystal Aging Af/f0 not production tested 0-10 years +5.0 ppm


Gate threshold voltage VGE = VCE,/C = 4 mA E(th) 4.5 5.5 6.5 V
Collector-emitter saturation voltage VGE = 15 V, /C = 100 A, Tj = 25 aC VGE = 15 V, /C = 100 A, Tj = 125 0C VCE(sat) 2.5 3.1 3 3.7
Zero gate voltage collector current VCE = 1200 V, VGE = 0 V, Tj = 25 aC VCE = 1200 V, VGE = 0 V, Tj = 125 aC /CES 1.5 6 2 mA
Gate-emitter leakage current VGE = 20 V, VCE = OV /GES 200 nA