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The ATF1516AS contains up t0 160 110 pins and 4 input pins, depending on the device type and package type selected. Each input pin and l/0 pin has its own boundary scan cell (BSC) in order to support boundary scan testing as described in detail by IEEE Standard 1149.1. Typical BSC consists of three capture registers or scan registers and up to two update registers. There are two types of BSCs, one for input or l/0 pin, and one for the macrocells. The BSCs in the device are chained together through the capture registers. Input to the capture register chain is fed in from the TDI pin while the output is directed to the TDO pin. Capture registers are used to capture active device data signals, to shift data in and out of the device and to load data into the update registers. Control signals are gen- erated internally by the JTAG TAP controller. The BSC configuration for the input and l/0 pins and macrocells are shown below.